FLIR cameras with Lock-In, Transient, and Pulse capability can perform advanced inspections such as Non-Destructive Testing (NDT) or stress mapping, resolving temperature differences as low as 1 mK. NDT is widely used to evaluate the properties of a material, component, or system without causing damage. IR cameras can detect internal defects through target excitation and the observation of thermal differences on a target’s surface. Thermal imaging is a valuable tool for detecting defects and points of failure in composites, solar cells, bridges, and electronics. It is also a great tool for thermal mapping of stress when performing materials testing.