THERMAL IMAGING SYSTEM FOR ELECTRONICS TESTING
Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
REDUCE TEST TIMES
This sensitive camera detects minute temperature shifts (< 0.06°C) and quantifies heat generation up to 250°C.
IMPROVE PRODUCT DESIGN
Offers 76,800 points of non-contact measurement and accuracy of ±3°C, so researchers can locate hot spots without concerns about heat sinks.
DESIGNED FOR BENCHTOP WORK
With a microscope-style stand that’s quick to set up and simplified features, ETS320 allow researchers to focus on their work.
|IR Resolution||320 x 240 (76,800 pixels)|
|Detector Type||Uncooled microbolometer|
|Spectral Range||7.5 – 13.0 µm|
|Thermal Sensitivity/NETD||< 0.06°C|
|Fixed Focus Distance||70 mm ± 10 mm|
|Spot Size @ Min. Focus||170 µm|
|Image Frequency||9 Hz|
|Measurement and Analysis|
|Object Temperature Range||-20°C to 250°C (-4°F to 482°F)|
|Accuracy||±3°C or ±3% of reading for ambient temperature 10°C to 35°C (50°F to 95°F)|
|Area||Box with max/min|
|Emissivity Correction||Variable from 0.1 to 1.0|
|Emissivity Table||Table of pre-defined materials|
|Reflected Apparent Temperature Correction||Automatic, based on input of reflected temperature|