THERMAL IMAGING SYSTEM FOR ELECTRONICS TESTING
FLIR ETS320
Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
REDUCE TEST TIMES
This sensitive camera detects minute temperature shifts (< 0.06°C) and quantifies heat generation up to 250°C.
IMPROVE PRODUCT DESIGN
Offers 76,800 points of non-contact measurement and accuracy of ±3°C, so researchers can locate hot spots without concerns about heat sinks.
DESIGNED FOR BENCHTOP WORK
With a microscope-style stand that’s quick to set up and simplified features, ETS320 allow researchers to focus on their work.
SPECIFICATIONS
| System Overview |
ETS320 |
|---|---|
| IR Resolution | 320 x 240 (76,800 pixels) |
| Detector Type | Uncooled microbolometer |
| Spectral Range | 7.5 – 13.0 µm |
| Thermal Sensitivity/NETD | < 0.06°C |
| Fixed Focus Distance | 70 mm ± 10 mm |
| F-number | 1.5 |
| Spot Size @ Min. Focus | 170 µm |
| Image Frequency | 9 Hz |
| Measurement and Analysis | |
| Object Temperature Range | -20°C to 250°C (-4°F to 482°F) |
| Accuracy | ±3°C or ±3% of reading for ambient temperature 10°C to 35°C (50°F to 95°F) |
| Spotmeter | Center spot |
| Area | Box with max/min |
| Emissivity Correction | Variable from 0.1 to 1.0 |
| Emissivity Table | Table of pre-defined materials |
| Reflected Apparent Temperature Correction | Automatic, based on input of reflected temperature |